Aert Lab

University of Antwerp

Vlaams Gewest (BE2) · Belgium

ERC-funded
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ERC Consolidator Grant · 2017

Picometer metrology for light-element nanostructures: making every electron count

Understanding nanostructures down to the atomic level is the key to optimise the design of advanced materials with revolutionary novel properties. This requires characterisation methods enabling one to quantify atomic structures with high precision. The strong interaction of accelerated electrons with matter makes that transmission electron microscopy is one of the most powerful techniques for this purpose. However, beam damage, induced by the high energy electrons, strongly hampers a detailed interpretation. To overcome this problem, I will usher electron microscopy in a new era of non-destructive picometer metrology. This is an extremely challenging goal in modern technology because of…

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